A Two Stage Group Acceptance Sampling Plans Based on Truncated Life Tests Using Log-Logistic and Gamma Distributions

Priyah Anburajan, A. R. Sudamani Ramaswamy

Abstract


In this paper, a two stage group acceptance sampling plan is developed for a truncated life test when the lifetime of an item follows Log Logistic and Gamma distributions. The minimum number of groups required for a given group size and the acceptance number is determined when the consumers risk and the test termination time are specified. The operating characteristic values according to various quality levels are obtained. The results are explained with examples.

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References


Abbur Razzaque Mughal, Muhammad Hanif and Azhar Ali Imran (2011): Economic Reliability Two Stage Group sampling plan for truncated life test having Weibull distribution. European Journal of Scientific Research. 54, 593 - 599.

Aslam, M. and C.H., 2009, A group acceptance sampling plans for truncated life tests based on the inverse Rayleigh and log-logistic distributions, Pak. J. Stat., 25: 107-119.

Epstein, B. (1954): Truncated life tests in the exponential case. Annals of Mathematical Statistics 25, 555-564.

Gupta, S. S. and Groll, P. A. (1961): Gamma distribution in acceptance sampling based on life tests. J. Amer. Statist. Assoc. 56, 942-970.

Gupta, R.D. and Kundu, D. (2003): Closeness between the gamma and generalized exponential distributions. Communications in Statistics - Theory and Methods 32, 705- 722.

Muhammad Aslam, Chi-Hyuck Jun, Munir Ahmad, 2009, A group acceptance plan based on truncated life test for Gamma distribution, Pak. J. Statist., Vol. 25(3), 333 - 340.

Wood. A., (1996). Predicting software reliability, IEEE Computer Vol. 29(11), pp. 69 78.


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